The SEM-FIB Workbench

نویسندگان

  • Kyunghwan Kim
  • Volker Klocke
چکیده

The Nanorobotics series developed by Klocke Nanotechnik extend Scanning Electron or Ion Microscopes to material processing systems. The included automation allows the whole field of handling, assembly and manufacturing like known from a normal desktop system – now with nano-precision, including various kinds of image generation by using different sensors. Applications are in the field of Material Research, Forensics, 3-Dimensional SEM/FIB, Tribology, Semiconductor, e-beam Lithography or X-Ray imaging up to complete NanoFabrication.

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تاریخ انتشار 2008